JMP For: Analytical Application Development • Business Visualization • Design of Experiments • Exploratory Data Analysis • Interactive Data Mining • Modeling • Quality Improvement • Reliability • Statistics • Visual Six Sigma
JMP® for Reliability
In any manufacturing endeavor – whether making semiconductors, light bulbs, automobiles, shoes, medical devices, or jet engines– product reliability strongly influences your business success. A product that functions as intended throughout its life guarantees happy customers who provide repeat business as well as referrals.
Dependable products also reduce warranty costs, which can otherwise quickly eat away at your profit margins. In contrast, product failure, or “field catastrophe,” diminishes consumer trust,tarnishes your brand and reputation, and reduces the likelihood that customers will return.
Preventing failure and improving warranty performance are two of the most important reasons for using proven techniques to fully understand the reliability of your products. JMP sets itself apart by integrating robust statistical analysis with dynamic data visualization to let you immediately spot trends and outliers in huge data sets. You can then improve reliability by pinpointing defects in materials or processes, finding design vulnerabilities and then determining how to correct them.
- Life Distribution
- Competing Causes
- Accelerated Testing
- Degradation Analysis
Do you need to determine the best distribution to use for making accurate reliability lifetime predictions on your products and components? Let JMP automatically evaluate a large range of reliability distributions to find the best fit. If you prefer, use nonparametric procedures, or manually select and compare parametric distributions. JMP supports all methods in one easy-to-use Life Distribution fitting platform.The dynamic Profilers in JMP enable you to interactively determine lifetime estimates and extrapolate to future time periods.
Life Distribution platform allows you to specify a nonparametric distribution as well as 15 parametric distributions. Parametric distributions include lognormal, Weibull loglogistic, Frechet, normal, SEV, logistic, LEV, exponential, log GenGamma, GenGamma, threshold lognormal, threshold Weibull, threshold loglogistic and threshold Frechet.
When you have multiple independent failure modes identified in your data, you can use the Life Distribution competing cause option to analyze each cause separately. You can omit causes interactively and assess potential improvement in product quality. This powerful option lets you assign specific fitted distributions to each failure mode.
Use the JMP Life Distribution and Survival platforms to estimate competing causes and assess the causes of individual failures, too.
The JMP Fit Life by X platform lets you model the relationship between the event and the factor of interest, using various transformations, including Arrhenius, voltage, linear, log, logit, location, and location and scale.
Create a custom transformation of the data and compare different distributions at the same factor level and the same distribution across different factor levels. Plus, you can show density curves and quantile lines for four different distributions for the lifetime event versus the accelerating factor.
The Degradation platform in JMP lets you analyze product deterioration data over time to help predict product quality and warranty risk. JMP enables you to analyze data resulting from both nondestructive (repeated measures or stability analysis) and destructive testing.Use the JMP Degradation platform to make performance predictions before products or components become ineffective (soft failures) or eventually become a hard failure.
Many failure mechanisms, such as tire wear, cracks, lasers or light bulbs, can be measured and analyzed as their performance degrades, eventually leading to weakness or hard failures. Generate pseudo-failure times to predict future performance.
More resources for Reliability
Demos
On-Demand Webcasts
Sample Data Sets
Reliability Data Sets from JMP Explorers Webcast in the JMP File Exchange
Contact JMP Sales
877.594.6567 (US)
